ELECTRON MICROSCOPE

Introduction

— At times it becomes necessary in metallurgical research to exa­mine metal structures at very high magnifications.

— Unfortunately the highest magnification possible with an ordinary optical metallurgical microscope (Fig. 42.1) is in the region of X2000.

— For very high-power microscopy (i.e., between X2000 and X200,000) light rays are replaced by a beam of electrons and this way developed an electron microscope.

Principle

(i) Preparation of metal/alloy specimen. Most electron microscopy is carried out by using transmission-type instruments that produce images of either transparent replicas of the etched specimen or of very thin metal films obtained by various techniques. It is necessary for electron micro­scope specimen to be transparent to the electron beam.

Replicas are produced in plastic or some other suitable material, which reproduces faithfully the contours of the polished and etched speci­men.

Thin foilsot the metals which work as (electron microscope) speci­men are of 100-2000. A° thickness and are prepared by several available methods, one of which is Ion Bombardment technique and another is Electropolishing method[1].

(ii) Construction and Operation

— An electron microscope consists of an electron gun and con­denser and projector lens. Vacuum is necessary to allow passage of the electron beam.

— Electrons emitted by a hot tungsten-filament cathode are acce­lerated, to form a high velocity beam, by the anode.

— Depending upon the density and thickness of the replica (specimen) at each point, some of the electrons are absorbed or scattered while the remainder pass through, i.e., transmit.

— The magnetic field of the objective lens focuses and enlarges the electron beam that has passed through the replica.

— Some of the electrons in this image are brought into a second focus on a fluorescent screen by the projector lens.


[1]For detail refer to Techniques of Electron Microscopy by D. H. Kay, Blackwell Scientific Publications. 1965.